D.O.R.C.  ZX-1 Mini Zoom Interferometer with electronic zoom measures the surface topography of connectors or fiber endface, bare fiber holder chuck with x.y.z and tilt micrometers.

Pictured without chuck, but chuck is included. 1.5mm, 2.5mm and FC chucks available. Please request chuck type at time of purchase.

Key Benefits

• Single unit can measure PC/APC connectors, ferrules, ferrule blanks, fiber cleaves, angled fiber cleaves and ribbon fibers
• Automated measurements for radius, apex offset, fiber height, key error and fiber/ferrule surface roughness using DORC's intuitive Windows XP® Professional based PMS software
• Extremely accurate and repeatable non-contact measurements in less than 1 second
• Extensive reporting, archiving and statistical analysis capabilities
• Automated scratch analysis
• Integrated control of popular IL/BR meters
• Available with dual-source extended range, for measuring fiber heights up to + 6mm
• Compliance with all "Standards Organizations" measurement methods worldwide
• Electronically controlled zoom objective, inspection and interferometric modes
• Fully enclosed vibration and contamination insensitive design
• Solid state illumination - no bulbs to change
• Low maintenance and automatic calibration

Product Information:
Direct Optical Research Company specializes in the design and manufacturing of non-contact interferometers for the optical fiber and connector industry. DORC's range of ZX-1 Zoom Interferometers and Phase Measuring System (PMS) software has been specifically designed to meet the ever-increasing need for accurate, automated, high volume testing of ferrules, ferrule blanks, connector assemblies, pigtails, patchcords, array connectors and optical fiber cleaves.

DORC's implementation of the Michelson Interferometer incorporates an electronically controlled zoom objective. Fringes created by introducing an internal reference path can be analyzed to measure the surface topography of a connector or fiber endface. The fully enclosed vibration and contamination resistant Michelson configuration eliminates the requirement for the delicate surface of the sample under test to be in physical contact with the measuring equipment. Being non-contact not only avoids contamination of both the sample and interferometer, but also removes the possibility of contamination induced measurement errors.